Physics of Failure - A Probabilistic Approach to Evaluate the Reliability of Piezoelectric Micro-Actuators
Year of publication: |
2005
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Authors: | He, Z. ; Loh, H.T. ; Ong, E.H. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 54.2005, 1, p. 83-91
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