Post-issue patent 'quality control' : a comparative study of US patent re-examinations and European patent oppositions
Erik J. H. Graham ...
| Year of publication: |
2002
|
|---|---|
| Authors: | Graham, Erik J. H. ; Hall, Bronwyn H. ; Harhoff, Dietmar ; Mowery, David C. |
| Publisher: |
Berkeley |
| Subject: | Patent | Patentrecht | Patent law | Vergleich | Comparison | EU-Staaten | EU countries | USA | United States |
| Extent: | 44, [1] S |
|---|---|
| Series: | Working paper / University of California at Berkeley, Department of Economics. - Santa Barbara, Calif., ZDB-ID 2213823-7. - Vol. 321 |
| Type of publication: | Book / Working Paper |
| Type of publication (narrower categories): | Arbeitspapier ; Working Paper ; Graue Literatur ; Non-commercial literature |
| Language: | English |
| Notes: | Internetausg.: http://repositories.cdlib.org/iber/econ/E02-321/ |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10001744252