Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics
| Year of publication: |
2009
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|---|---|
| Authors: | Patil, N. ; Celaya, J. ; Das, D. ; Goebel, K. ; Pecht, M. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 58.2009, 2, p. 271-276
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