Quality-yield measure for production processes with very low fraction defective
Year of publication: |
2004
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Authors: | Pearn, W.L. ; Chang, Y.C. ; Wu, Chien-Wei |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 42.2004, 23, p. 4909-4926
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