Random effects logistic regression model for default prediction of technology credit guarantee fund
Year of publication: |
2007
|
---|---|
Authors: | Sohn, So Young ; Kim, Hong Sik |
Published in: |
European Journal of Operational Research. - Elsevier, ISSN 0377-2217. - Vol. 183.2007, 1, p. 472-478
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Publisher: |
Elsevier |
Saved in:
Online Resource
Saved in favorites
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