Reliability and Risk: A Bayesian Perspective by Singpurwalla, N. D.
Year of publication: |
2008
|
---|---|
Authors: | Ryan, Louise M. |
Published in: |
Biometrics. - The International Biometric Society. - Vol. 64.2008, 2, p. 657-658
|
Publisher: |
The International Biometric Society |
Saved in:
Online Resource
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