Reliability of a standby system with beta-distributed component lives
Year of publication: |
1994
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Authors: | Pham, T. ; Turkkan, N. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 43.1994, 1, p. 71-75
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