Returns to Scale on Nonparametric Deterministic Technologies: Simplifying Goodness-of-Fit Methods Using Operations on Technologies
Year of publication: |
2000
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Authors: | Briec, Walter ; Kerstens, Kristiaan ; Leleu, Hervé ; Eeckaut, Philippe Vanden |
Published in: |
Journal of productivity analysis. - Dordrecht [u.a.] : Springer, ISSN 0895-562X, ZDB-ID 10074041. - Vol. 14.2000, 3, p. 267
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