Risk Retention : the journey thus far
Ed De Sear and John Hwang
| Year of publication: |
2011
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|---|---|
| Authors: | Sear, Ed De ; Hwang, John |
| Published in: |
The journal of structured finance. - New York, NY : Institutional Investor, Inc., ISSN 1082-3220, ZDB-ID 22338986. - Vol. 17.2011, 1, p. 31-35
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| Type of publication: | Article |
|---|---|
| Language: | English |
| Source: |
Persistent link: https://www.econbiz.de/10009882028