Semiconductor manufacturing : decision analysis for fab site selection
Tugrul U. Daim; Ramin Neshati
Year of publication: |
2010
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Authors: | Daim, Tugrul U. ; Neshati, Ramin |
Published in: |
International journal of decision sciences, risk and management. - Genève : Inderscience, ISSN 1753-7169, ZDB-ID 25122769. - Vol. 2.2010, 3/4, p. 199-216
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