Semiparametric estimation of Value at Risk
Year of publication: |
2003
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Authors: | Fan, Jianqing ; Gu, Juan |
Published in: |
The econometrics journal. - Oxford [u.a.] : Wiley-Blackwell, ISSN 1368-4221, ZDB-ID 14122650. - Vol. 6.2003, 2, p. 261-290
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Saved in:
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