Sequential testing for two exponential distributions at arbitrary risks
Year of publication: |
2012
|
---|---|
Authors: | Michlin, Yefim H. ; Kaplunov, Vladimir ; Ingman, Dov |
Published in: |
International journal of quality & reliability management. - Bingley : Emerald Group Publishing Limited, ISSN 0265-671X, ZDB-ID 51787-2. - Vol. 29.2012, 4, p. 451-468
|
Subject: | Halbleiterindustrie | Semiconductor industry | Qualitätsmanagement | Quality management | Instandhaltung | Maintenance policy | Sequentialtest | Sequential test |
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