Simple and powerful GMM over-identification tests with accurate size
Year of publication: |
2012
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Authors: | Sun, Yixiao ; Kim, Min Seong |
Published in: |
Journal of econometrics. - Amsterdam [u.a.] : Elsevier, ISSN 0304-4076, ZDB-ID 1848616. - Vol. 166.2012, 2, p. 267-282
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