Smearing origin of zero-bias conductance peak in Ag-SiO-Bi<Subscript>2</Subscript>Sr<Subscript>2</Subscript>CaCu<Subscript>2</Subscript>O<Subscript>8+δ</Subscript> planar tunnel junctions: influence of diffusive normal metal verified with the circuit theory
Year of publication: |
2006
|
---|---|
Authors: | Shigeta, I. ; Tanaka, Y. ; Ichikawa, F. ; Asano, Y. |
Published in: |
The European Physical Journal B - Condensed Matter and Complex Systems. - Springer. - Vol. 54.2006, 2, p. 141-149
|
Publisher: |
Springer |
Subject: | 74.25.Fy Transport properties (electric and thermal conductivity | thermoelectric effects | etc.) | 74.45.+c Proximity effects | Andreev effect | SN and SNS junctions | 74.50.+r Tunneling phenomena | point contacts | weak links | Josephson effects | 74.72.Hs Bi-based cuprates |
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