SPC Monitoring of MMSE- and PI-Controlled Processes
Year of publication: |
2002
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Authors: | Jiang, Wei ; Tsui, Kwok-Leung |
Published in: |
Journal of quality technology : a quarterly journal of methods, applications and related topics. - Milwaukee, Wis. : ASQ, ISSN 0022-4065, ZDB-ID 4105126. - Vol. 34.2002, 4, p. 384-398
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