SPECIAL ISSUE RESEARCH ARTICLES - Hierarchical Segmentation of R&D Process and Intellectual Property Protection: Evidence From Multinational R&D Laboratories in China
| Year of publication: |
2010
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| Authors: | Wu, X ; Ma, R ; Shi, Y |
| Published in: |
IEEE transactions on engineering management : EM. - New York, NY : IEEE, ISSN 0018-9391, ZDB-ID 1604387. - Vol. 57.2010, 1, p. 9-22
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