Statistical and intelligent reliability analysis of multi-layer ceramic capacitor for ground mobile applications using Taguchi's approach
Year of publication: |
2022
|
---|---|
Authors: | Bhargava, Cherry ; Sharma, Pardeep Kumar |
Published in: |
International journal of quality & reliability management. - Bingley : Emerald, ISSN 1758-6682, ZDB-ID 1466792-7. - Vol. 39.2022, 10, p. 2273-2285
|
Subject: | ANN | MILHDBK-217F | MLCC | Regression | Reliability | Taguchi's approach |
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