Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
| Year of publication: |
2002
|
|---|---|
| Authors: | Tong, Lee-Ing ; Chen, K.S. ; Chen, H.T. |
| Published in: |
International journal of quality & reliability management. - Bradford : Emerald, ISSN 0265-671X, ZDB-ID 517872. - Vol. 19.2002, 6-7, p. 812-824
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