SYMPOSIUM ON THE PATENT SYSTEM AND INNOVATION - Characteristics of Patent Litigation: A Window on Competition
Year of publication: |
2001
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Authors: | Lanjouw, Jean O. ; Schankerman, Mark |
Published in: |
The Rand journal of economics. - Hoboken, NJ : Wiley, ISSN 0741-6261, ZDB-ID 7981314. - Vol. 32.2001, 1, p. 129-151
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