TAKING THE EASY WAY OUT: HOW THE GED TESTING PROGRAM INDUCES STUDENTS TO DROP OUT
Year of publication: |
2008
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Authors: | Heckman, James J. ; LaFontaine, Paul A. ; Rodriguez, Pedro L. |
Published in: |
Working paper / National Bureau of Economic Research, Inc. - Cambridge, Mass, ISSN 0898-2937, ZDB-ID 12239057. - 2008, 14044
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