Taxonomy of new product development process risks : an empirical study of Indian automotive industry
Year of publication: |
2022
|
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Authors: | Chauhan, Avanish Singh ; Nepal, Bimal ; Soni, Gunjan ; Rathore, Ajay Pal Singh |
Published in: |
IEEE transactions on engineering management : EM. - New York, NY : IEEE, ISSN 0018-9391, ZDB-ID 160438-7. - Vol. 69.2022, 5, p. 1987-1998
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Subject: | Automotive industry | factor analysis | new product development (NPD) | NPD risk factors | taxonomy of NPD risks | Innovation | Kfz-Industrie | Indien | India | Industrie | Manufacturing industries |
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