Technology emergence between mandate and acceptance: an exploratory examination of RFID
Year of publication: |
2011
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Authors: | Kros, John F. ; Jr, R. Glenn Richey ; Chen, Haozhe ; Nadler, S. Scott |
Published in: |
International journal of physical distribution & logistics management : IJPD & LM. - Bradford : Emerald, ISSN 0020-7527, ZDB-ID 1842791. - Vol. 41.2011, 7 (9.8.), p. 697-717
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