Testing process performance based on capability index Cpk with critical values
Year of publication: |
2004
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Authors: | Pearn, W.L. ; Lin, P.C. |
Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 47.2004, 4, p. 351-370
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