Testing - Variables Sampling Plans for Weibull Distributed Lifetimes Under Sudden Death Testing
| Year of publication: |
2006
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|---|---|
| Authors: | Jun, C.-H. ; Balamurali, S. ; Lee, S.-H. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 55.2006, 1, p. 53-58
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