The case for standard measures of patent quality
Year of publication: |
2011
|
---|---|
Authors: | Kappos, David J. ; Graham, Stuart J. H. |
Published in: |
MIT sloan management review. - Cambridge, Mass. : MIT, ISSN 1532-9194, ZDB-ID 2039388-X. - Vol. 53.2011/12, 3, p. 19-22
|
Subject: | Patent | Messung | Measurement | Patentrecht | Patent law | Standardisierung | Standardization |
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