The relationship between yield and flow time in a production system under inspection
Year of publication: |
2012
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Authors: | Tirkel, Israel ; Rabinowitz, Gad |
Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 50.2012, 14 (15.7.), p. 3686-3697
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Subject: | flow time | inspection | queueing systems | scheduling | semiconductors manufacture | yield | Produktionssystem | Manufacturing system | Produktionssteuerung | Production control | Halbleiterindustrie | Semiconductor industry | USA | United States | Theorie | Theory |
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