The value and indicator function of patents
Year of publication: |
2010
|
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Authors: | Frietsch, Rainer ; Schmoch, Ulrich ; Van Looy, Baart ; Walsh, J. P. ; Devroede, R. ; Du Plessis, M. ; Jung, T. ; Meng, Y. ; Neuhäusler, Peter ; Peeters, B. ; Schubert, T. |
Publisher: |
Berlin : Expertenkommission Forschung und Innovation (EFI) |
Subject: | Patent | Bewertung | Wirtschaftsindikator | Bibliometrie | Wettbewerbsstrategie | EU-Staaten |
Series: | Studien zum deutschen Innovationssystem ; 15-2010 |
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Type of publication: | Book / Working Paper |
Type of publication (narrower categories): | Research Report |
Language: | English |
Other identifiers: | 641690401 [GVK] hdl:10419/156544 [Handle] RePEc:zbw:efisdi:152010 [RePEc] |
Source: |
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