Transient behavior of time-between-failures of complex repairable systems
Year of publication: |
2002
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Authors: | Keats, J.Bert ; Chambal, Stephen P. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 18.2002, 4, p. 293-298
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Saved in:
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