Why and how ITRS worked to recover the breakdown of "Scaling Law" in 2000s : structural frame analysis of Si-CMOS semiconductor technologies
Year of publication: |
2021
|
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Authors: | Yasunaga, Yuko |
Published in: |
IEEE transactions on engineering management : EM. - New York, NY : IEEE, ISSN 0018-9391, ZDB-ID 160438-7. - Vol. 68.2021, 4, p. 1179-1194
|
Subject: | Moore's Law | planar technology | semiconductor | Si-CMOS | technology roadmap |
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