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~isPartOf:"IEEE transactions on reliability : R ; IEEE T R"
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Navarro, J.
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Balakrishnan, N
1
Hernandez, P.J.
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Navarro, J
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Ng, H K T
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IEEE transactions on reliability : R ; IEEE T R
Investigaciones europeas de Dirección y Economía de la Empresa : IEDEE
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Life Testing and Analysis - Linear Inference for Type-II Censored Lifetime Data of Reliability Systems With Known Signatures
Balakrishnan, N
;
Ng, H K T
;
Navarro, J
- In:
IEEE transactions on reliability : R ; IEEE T R
60
(
2011
)
2
,
pp. 426-441
Persistent link: https://www.econbiz.de/10009167601
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2
Parametric Reliability - Bathtub Shaped Failure Rates From Mixtures: A Practical Point of View
Wondmagegnehu, E.T.
;
Navarro, J.
;
Hernandez, P.J.
- In:
IEEE transactions on reliability : R ; IEEE T R
54
(
2005
)
2
,
pp. 270-275
Persistent link: https://www.econbiz.de/10006606832
Saved in:
3
Failure-rate functions for doubly-truncated random variables
Navarro, J.
;
Ruiz, J.
- In:
IEEE transactions on reliability : R ; IEEE T R
45
(
1996
)
4
,
pp. 685-690
Persistent link: https://www.econbiz.de/10006632636
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