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Navarro, J
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IEEE transactions on reliability : R ; IEEE T R
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Life Testing and Analysis - Linear Inference for Type-II Censored Lifetime Data of Reliability Systems With Known Signatures
Balakrishnan, N
;
Ng, H K T
;
Navarro, J
- In:
IEEE transactions on reliability : R ; IEEE T R
60
(
2011
)
2
,
pp. 426-441
Persistent link: https://www.econbiz.de/10009167601
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