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~person:"Turkkan, N."
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Turkkan, N.
Pham-Gia, T.
8
Bekker, A.
2
Pham, T.
2
Duong, Q. P.
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Pham-gia, T.
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IEEE transactions on reliability : R ; IEEE T R
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Erratum to: Exact expression of the density of the sample generalized variance and applications
Pham-Gia, T.
;
Turkkan, N.
- In:
Statistical Papers
52
(
2011
)
3
,
pp. 749-749
Persistent link: https://www.econbiz.de/10009324995
Saved in:
2
Exact expression of the density of the sample generalized variance and applications
Pham-Gia, T.
;
Turkkan, N.
- In:
Statistical Papers
51
(
2010
)
4
,
pp. 931-945
Persistent link: https://www.econbiz.de/10008775892
Saved in:
3
Bounds for the Bayes Error in Classification: A Bayesian Approach Using Discriminant Analysis
Pham-Gia, T.
;
Turkkan, N.
;
Bekker, A.
- In:
Statistical Methods and Applications
16
(
2007
)
1
,
pp. 7-26
Persistent link: https://www.econbiz.de/10005596343
Saved in:
4
Reliability Distributions - System Stress-Strength Reliability:The Multivariate Case
Turkkan, N.
;
Pham-Gia, T.
- In:
IEEE transactions on reliability : R ; IEEE T R
56
(
2007
)
1
,
pp. 115-124
Persistent link: https://www.econbiz.de/10007611257
Saved in:
5
Bayesian Analysis in the L <Superscript>1</Superscript>-Norm of the Mixing Proportion Using Discriminant Analysis
Pham-Gia, T.
;
Turkkan, N.
;
Bekker, A.
- In:
Metrika
64
(
2006
)
1
,
pp. 1-22
Persistent link: https://www.econbiz.de/10005756387
Saved in:
6
STANDBY SYSTEM AVAILABILITY USING GAMMA APPROXIMATION
Pham-gia, T.
;
Turkkan, N.
- In:
American journal of mathematical and management sciences
23
(
2003
)
3-4
,
pp. 239-266
Persistent link: https://www.econbiz.de/10006819326
Saved in:
7
The product and quotient of general beta distributions
Pham-Gia, T.
;
Turkkan, N.
- In:
Statistical Papers
43
(
2002
)
4
,
pp. 537-550
Persistent link: https://www.econbiz.de/10005167174
Saved in:
8
System Availability in a Gamma Alternating Renewal Process
Pham-Gia, T.
;
Turkkan, N.
- In:
Naval research logistics : an international journal
46
(
1999
)
7
,
pp. 822-844
Persistent link: https://www.econbiz.de/10005965177
Saved in:
9
The Lorenz and scaled total-time-on-test-transform curves: A unified approach
Pham, T.
;
Turkkan, N.
- In:
IEEE transactions on reliability : R ; IEEE T R
43
(
1994
)
1
,
pp. 76-83
Persistent link: https://www.econbiz.de/10006637030
Saved in:
10
Reliability of a standby system with beta-distributed component lives
Pham, T.
;
Turkkan, N.
- In:
IEEE transactions on reliability : R ; IEEE T R
43
(
1994
)
1
,
pp. 71-75
Persistent link: https://www.econbiz.de/10006637031
Saved in:
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