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Ng, H.K.T.
4
Balakrishnan, N.
3
Kannan, N.
2
Balakrishnan, N
1
Chan, P.S.
1
Lin, C.T.
1
Navarro, J
1
Ng, H K T
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IEEE transactions on reliability : R ; IEEE T R
4
Naval research logistics : an international journal
1
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OLC EcoSci
RePEc
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1
Life Testing and Analysis - Linear Inference for Type-II Censored Lifetime Data of Reliability Systems With Known Signatures
Balakrishnan, N
;
Ng, H K T
;
Navarro, J
- In:
IEEE transactions on reliability : R ; IEEE T R
60
(
2011
)
2
,
pp. 426-441
Persistent link: https://www.econbiz.de/10009167601
Saved in:
2
Optimal sample size allocation for tests with multiple levels of stress with extreme value regression
Ng, H.K.T.
;
Balakrishnan, N.
;
Chan, P.S.
- In:
Naval research logistics : an international journal
54
(
2007
)
3
,
pp. 237-249
Persistent link: https://www.econbiz.de/10007604287
Saved in:
3
Parametrics - Parameter Estimation for a Modified Weibull Distribution, for Progressively Type-II Censored Samples
Ng, H.K.T.
- In:
IEEE transactions on reliability : R ; IEEE T R
54
(
2005
)
3
,
pp. 374-380
Persistent link: https://www.econbiz.de/10006606194
Saved in:
4
Estimation - Goodness-of-Fit Tests Based on Spacings for Progressively Type-II Censored Data From a General Location-Scale Distribution
Balakrishnan, N.
;
Ng, H.K.T.
;
Kannan, N.
- In:
IEEE transactions on reliability : R ; IEEE T R
53
(
2004
)
3
,
pp. 349-356
Persistent link: https://www.econbiz.de/10006609048
Saved in:
5
Point and Interval Estimation for Gaussian Distribution, Based on Progressively Type-II Censored Samples
Balakrishnan, N.
;
Kannan, N.
;
Lin, C.T.
;
Ng, H.K.T.
- In:
IEEE transactions on reliability : R ; IEEE T R
52
(
2003
)
1
,
pp. 90-95
Persistent link: https://www.econbiz.de/10006614195
Saved in:
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