//--> //--> //-->
Toggle navigation
Logout
Change account settings
EN
DE
ES
FR
A-Z
Beta
About EconBiz
News
Thesaurus (STW)
Research Skills
Help
EN
DE
ES
FR
My account
Logout
Change account settings
Login
Publications
Events
Your search terms
Search
Retain my current filters
~source:"olc"
Search options
All Fields
Title
Exact title
Subject
Author
Institution
ISBN/ISSN
Published in...
Publisher
Open Access only
Advanced
Search history
My EconBiz
Favorites
Loans
Reservations
Fines
You are here:
Home
Search: person:"Turkkan, N."
Narrow search
Delete all filters
| 1 applied filter
Year of publication
From:
To:
Type of publication
All
Article
5
Language
All
Undetermined
5
Author
All
Turkkan, N.
5
Pham, T.
2
Pham-Gia, T.
2
Pham-gia, T.
1
Published in...
All
IEEE transactions on reliability : R ; IEEE T R
3
American journal of mathematical and management sciences
1
Naval research logistics : an international journal
1
Source
All
OLC EcoSci
RePEc
6
Showing
1
-
5
of
5
Sort
relevance
articles prioritized
date (newest first)
date (oldest first)
1
Reliability Distributions - System Stress-Strength Reliability:The Multivariate Case
Turkkan, N.
;
Pham-Gia, T.
- In:
IEEE transactions on reliability : R ; IEEE T R
56
(
2007
)
1
,
pp. 115-124
Persistent link: https://www.econbiz.de/10007611257
Saved in:
2
STANDBY SYSTEM AVAILABILITY USING GAMMA APPROXIMATION
Pham-gia, T.
;
Turkkan, N.
- In:
American journal of mathematical and management sciences
23
(
2003
)
3-4
,
pp. 239-266
Persistent link: https://www.econbiz.de/10006819326
Saved in:
3
System Availability in a Gamma Alternating Renewal Process
Pham-Gia, T.
;
Turkkan, N.
- In:
Naval research logistics : an international journal
46
(
1999
)
7
,
pp. 822-844
Persistent link: https://www.econbiz.de/10005965177
Saved in:
4
The Lorenz and scaled total-time-on-test-transform curves: A unified approach
Pham, T.
;
Turkkan, N.
- In:
IEEE transactions on reliability : R ; IEEE T R
43
(
1994
)
1
,
pp. 76-83
Persistent link: https://www.econbiz.de/10006637030
Saved in:
5
Reliability of a standby system with beta-distributed component lives
Pham, T.
;
Turkkan, N.
- In:
IEEE transactions on reliability : R ; IEEE T R
43
(
1994
)
1
,
pp. 71-75
Persistent link: https://www.econbiz.de/10006637031
Saved in:
Results per page
10
25
50
100
250
A service of the
zbw
×
Loading...
//-->