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Technovation : the international journal of technological innovation, entrepreneurship and technology management
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Mapping the broad societal impact of patents
Waal, Mark B. van der
;
Feddema, Jelle J.
;
Burgwal, …
- In:
Technovation : the international journal of …
128
(
2023
),
pp. 1-15
Persistent link: https://www.econbiz.de/10014490996
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