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PHASE TRANSFORMATION AND R–T CHARACTERISTICS OF VACUUM ANNEALED VANADIUM OXIDE THIN FILMS
WANG, Y. L.
;
LI, M. C.
;
ZHAO, L. C.
- In:
Surface Review and Letters (SRL)
15
(
2008
)
01
,
pp. 59-64
grain size ranging from 80 to 300 nm and the Ra being about 20nm. The lowest
temperature
coefficient
of resistance at …
Persistent link: https://www.econbiz.de/10005050582
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