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Search: person:"Tai, Y. T."
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Tai, Y. T.
6
Pearn, Wen-lea
5
Pearn, W.L.
4
Tai, Y.T.
4
Chung, S.H.
2
Chung, Sai Ho
2
Hong, J. S.
1
Hong, J.S.
1
Lee, J. H.
1
Lee, J.H.
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Li, M. Y.
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Pearn, W. L.
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International journal of production research
3
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers
3
Journal of the Operational Research Society : OR
2
Journal of the Operational Research Society
1
Quality and reliability engineering international
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ECONIS (ZBW)
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1
Improved profit model for production of MicroLED PCB with asymmetric specifications
Wu, C. H.
;
Pearn, Wen-lea
;
Tai, Y. T.
- In:
Journal of the Operational Research Society
74
(
2023
)
1
,
pp. 48-58
Persistent link: https://www.econbiz.de/10014231638
Saved in:
2
The burn-in test scheduling problem with batch dependent processing time and sequence dependent setup time
Pearn, Wen-lea
;
Hong, J. S.
;
Tai, Y. T.
- In:
International journal of production research
51
(
2013
)
6
,
pp. 1694-1706
Persistent link: https://www.econbiz.de/10009705684
Saved in:
3
The burn-in test scheduling problem with batch dependent processing time and sequence dependent setup time
Pearn, W.L.
;
Hong, J.S.
;
Tai, Y.T.
- In:
International journal of production research : American …
51
(
2013
)
6
,
pp. 1694-1706
Persistent link: https://www.econbiz.de/10010054363
Saved in:
4
Cycle time estimation for semiconductor final testing processes with Weibull-distributed weiting time
Tai, Y. T.
;
Pearn, Wen-lea
;
Lee, J. H.
- In:
International journal of production research
50
(
2012
)
2
,
pp. 581-592
Persistent link: https://www.econbiz.de/10009549619
Saved in:
5
Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time
Tai, Y.T.
;
Pearn, W.L.
;
Lee, J.H.
- In:
International journal of production research : American …
50
(
2012
)
2
,
pp. 581-593
Persistent link: https://www.econbiz.de/10009962228
Saved in:
6
Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk
Pearn, W. L.
;
Shiau, J.‐J. H.
;
Tai, Y. T.
;
Li, M. Y.
- In:
Quality and reliability engineering international
27
(
2011
)
8
,
pp. 1119-1130
Persistent link: https://www.econbiz.de/10009800606
Saved in:
7
Minimising makespan on parallel batch processing machines with non-identical ready time and arbitrary job sizes
Chung, Sai Ho
;
Tai, Y. T.
;
Pearn, Wen-lea
- In:
International journal of production research
47
(
2009
)
18
,
pp. 5109-5128
Persistent link: https://www.econbiz.de/10003891275
Saved in:
8
Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time
Chung, Sai Ho
;
Pearn, Wen-lea
;
Tai, Y. T.
- In:
Journal of the Operational Research Society : OR
60
(
2009
)
7
,
pp. 921-933
Persistent link: https://www.econbiz.de/10003869809
Saved in:
9
Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time
Chung, S.H.
;
Pearn, W.L.
;
Tai, Y.T.
- In:
Journal of the Operational Research Society : OR
60
(
2009
)
7
,
pp. 921-933
Persistent link: https://www.econbiz.de/10008261992
Saved in:
10
Minimising makespan on parallel batch processing machines with non-identical ready time and arbitrary job sizes
Chung, S.H.
;
Tai, Y.T.
;
Pearn, W.L.
- In:
International journal of production research : American …
47
(
2009
)
18
,
pp. 5109-5128
Persistent link: https://www.econbiz.de/10008268735
Saved in:
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