Wang, Chih-Hsiung - In: European Journal of Operational Research 197 (2009) 1, pp. 126-133
In this study, we reformulated the problem of wafer probe operation in semiconductor manufacturing to consider a probe machine (PM) which has a discrete Weibull shift distribution with a nondecreasing failure rate. To maintain the imperfect PM during the probing of a lot of wafers, a minimal...