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Efficiency Robust Tests for Survival or Ordered Categorical Data
RYAN, LOUISE M.; Freidlin, Boris; Podgor, Marvin J.; … - In: Biometrics 55 (1999) 3, pp. 883-886
Persistent link: https://www.econbiz.de/10010946467
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Local EM Estimation of the Hazard Function for Interval-Censored Data
Betensky, Rebecca A.; Lindsey, Jane C.; Ryan, Louise M.; … - In: Biometrics 55 (1999) 1, pp. 238-245
Persistent link: https://www.econbiz.de/10010946540
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Synthesis of Evidence from Epidemiological Studies with Interval-Censored Exposure Due to Grouping
Cook, Richard J.; Brumback, Babette B.; Wigg, Melanie B.; … - In: Biometrics 57 (2001) 3, pp. 671-680
Persistent link: https://www.econbiz.de/10010946871
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Poisson Regression with Missing Durations of Exposure
Ryan, Louise M.; Lin, D. Y.; Arbogast, P.; Siscovick, D. S. - In: Biometrics 55 (1999) 1, pp. 252-257
Persistent link: https://www.econbiz.de/10010946909
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Individual and Population Penalized Regression Splines for Accelerated Longitudinal Designs
Harezlak, Jaroslaw; Ryan, Louise M.; Giedd, Jay N.; … - In: Biometrics 61 (2005) 4, pp. 1037-1048
Persistent link: https://www.econbiz.de/10010947320
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Penalized Item Response Theory Models: Application to Epigenetic Alterations in Bladder Cancer
Houseman, E. Andrés; Marsit, Carmen; Karagas, Margaret; … - In: Biometrics 63 (2007) 4, pp. 1269-1277
Persistent link: https://www.econbiz.de/10010947461
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Reliability and Risk: A Bayesian Perspective by Singpurwalla, N. D.
Ryan, Louise M. - In: Biometrics 64 (2008) 2, pp. 657-658
Persistent link: https://www.econbiz.de/10010948264
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Fitting Nonlinear and Constrained Generalized Estimating Equations with Optimization Software
Contreras, Martha; Ryan, Louise M. - In: Biometrics 56 (2000) 4, pp. 1268-1271
Persistent link: https://www.econbiz.de/10010948279
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Semiparametric Models for Missing Covariate and Response Data in Regression Models
Chen, Qingxia; Ibrahim, Joseph G. - In: Biometrics 62 (2006) 1, pp. 177-184
Persistent link: https://www.econbiz.de/10010946416
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Proximity Model for Expression Quantitative Trait Loci (eQTL) Detection
Gelfond, Jonathan A. L.; Ibrahim, Joseph G.; Zou, Fei - In: Biometrics 63 (2007) 4, pp. 1108-1116
Persistent link: https://www.econbiz.de/10010946531