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~isPartOf:"International journal of production research"
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A data-driven method for enhancing the image-based automatic inspection of IC wire bonding defects
Chen, Junlong
;
Zhang, Zijun
;
Wu, Feng
- In:
International journal of production research
59
(
2021
)
16
,
pp. 4779-4793
Persistent link: https://www.econbiz.de/10012625723
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