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A multivariate parameter trace analysis for online fault detection in a semiconductor etch tool
Ko, Jong Myoung; Kim, Chang Ouk - In: International journal of production research : American … 50 (2012) 23, pp. 6639-6655
Persistent link: https://www.econbiz.de/10010037846
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A multicriteria approach to timeout collaboration protocol
Kwak, Choonjong; Kim, Chang Ouk - In: International journal of production research : American … 47 (2009) 22, pp. 6417-6432
Persistent link: https://www.econbiz.de/10008287648
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RFID systems implementation: a comprehensive framework and a case study
Hong, Seong Rok; Kim, Shin Tae; Kim, Chang Ouk - In: International journal of production research : American … 48 (2010) 9, pp. 2583-2613
Persistent link: https://www.econbiz.de/10008394998
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Situation dependent decision selector for production control in testing and rework cell
Kwak, Choonjong; Park, Eunmi; Kim, Chang Ouk - In: International journal of production research : American … 49 (2011) 15, pp. 4505-4517
Persistent link: https://www.econbiz.de/10009163531
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A two-phase heuristic algorithm for cell formation problems considering alternative part routes and machine sequences
Ouk Kim, Chang; Baek, Jun-Geol; Baek, Jong-Kwan - In: International journal of production research : American … 42 (2004) 18, pp. 3911-3928
Persistent link: https://www.econbiz.de/10006125153