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The case for standard measures of patent quality
Kappos, David J.
;
Graham, Stuart J. H.
- In:
MIT sloan management review
53
(
2011/12
)
3
,
pp. 19-22
Persistent link: https://www.econbiz.de/10009535702
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THE CASE FOR STANDARD MEASURES OF PATENT QUALITY
Kappos, David J
;
Graham, Stuart
- In:
MIT sloan management review
53
(
2012
)
3
,
pp. 19-25
Persistent link: https://www.econbiz.de/10009849128
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