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The optimization of multi-response problems in the Taguchi method
Tong, Lee-Ing; Su, Chao-Ton; Wang, Chung-Ho - In: International journal of quality & reliability management 14 (1997) 4-5, pp. 367-380
Persistent link: https://www.econbiz.de/10006396018
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Multi-response robust design by principal component analysis
Su, Chao-Ton; Tong, Lee-Ing - In: Total quality management 8 (1997) 6, pp. 409-416
Persistent link: https://www.econbiz.de/10007195542
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Optimization of a multi-response problem in Taguchi's dynamic system
Hsieh, Kun-Lin; Tong, Lee-Ing; Chiu, Hung-Pin; Yeh, Hsin-Ya - In: Computers & industrial engineering : CAIE ; an … 49 (2005) 4, pp. 556-571
Persistent link: https://www.econbiz.de/10005919981
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Dynamic multiple responses by ideal solution analysis
Tong, Lee-Ing; Wang, Chung-Ho; Chen, Chih-Chien; Chen, … - In: European journal of operational research : EJOR 156 (2004) 2, pp. 433-444
Persistent link: https://www.econbiz.de/10006647902
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F INFORMATION COMMERCE & TECHNOLOGY - A novel means of applying neural networks to optimize the Fb:000 multiresponse problem
Tong, Lee-Ing; Hsieh, Kun-Lin - In: Operations research, Management science : OR MS ; the … 41 (2001) 5, pp. 581-582
Persistent link: https://www.econbiz.de/10006511287
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Forecasting energy consumption using a grey model improved by incorporating genetic programming
Lee, Yi-Shian; Tong, Lee-Ing - In: Energy conversion and management : ECM 52 (2011) 1, pp. 147-153
Persistent link: https://www.econbiz.de/10008770080
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Bi-criteria minimization for the permutation flowshop scheduling problem with machine-based learning effects
Chung, Yu-Hsiang; Tong, Lee-Ing - In: Computers & industrial engineering : CAIE ; an … 63 (2012) 1, pp. 302-313
Persistent link: https://www.econbiz.de/10009972259
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Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
Tong, Lee-Ing; Chen, K.S.; Chen, H.T. - In: International journal of quality & reliability management 19 (2002) 6-7, pp. 812-824
Persistent link: https://www.econbiz.de/10006373618
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Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
Tong, Lee-Ing; Chen, K.S.; Chen, H.T. - In: International journal of quality & reliability management 19 (2002) 7, pp. 812-824
Persistent link: https://www.econbiz.de/10006373837
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Number 6 - Average type-II censoring time for two-parameter Pareto and Rayleigh distributions
Chiou, Kuo-Ching; Tong, Lee-Ing - In: International journal of quality & reliability management 18 (2001) 6-7, pp. 643-656
Persistent link: https://www.econbiz.de/10006378820