MAHMOOD, KHALIQ; BASHIR, SHAZIA; AKRAM, MAHREEN; HAYAT, ASMA - In: Surface Review and Letters (SRL) 22 (2015) 02, pp. 1550020-1
Pulse laser deposited thin films of TiN are irradiated by 1 MeV carbon (C+) ions beam for various doses ranging 0.4 to 2.8 × 1014 ions/cm2. Atomic force microscopy (AFM) analysis reveals the formation of hillocks like structures after ion irradiation. X-ray diffraction (XRD) investigations show...