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Erdmann, Tashi P
Mast, Jeroen de
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Journal of quality technology : a quarterly journal of methods, applications and related topics
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Measurement System Analysis for Binary Inspection: Continuous Versus Dichotomous Measurands
de Mast, Jeroen
;
Erdmann, Tashi P
;
van Wieringen, Wessel N
- In:
Journal of quality technology : a quarterly journal of …
43
(
2011
)
2
,
pp. 99-113
Persistent link: https://www.econbiz.de/10008930619
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