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Frey, Silvia
Siegrist, Michael
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Risk analysis : an international journal
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Laypeople's and Experts' Perception of Nanotechnology Hazards
Siegrist, Michael
;
Keller, Carmen
;
Kastenholz, Hans
; …
- In:
Risk analysis : an international journal
27
(
2007
)
1
,
pp. 59-70
Persistent link: https://www.econbiz.de/10007603549
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