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Lee, J.H.
Pearn, W.L.
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International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers
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Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time
Tai, Y.T.
;
Pearn, W.L.
;
Lee, J.H.
- In:
International journal of production research : American …
50
(
2012
)
2
,
pp. 581-593
Persistent link: https://www.econbiz.de/10009962228
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