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Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time
Tai, Y.T.; Pearn, W.L.; Lee, J.H. - In: International journal of production research : American … 50 (2012) 2, pp. 581-593
Persistent link: https://www.econbiz.de/10009962228
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The burn-in test scheduling problem with batch dependent processing time and sequence dependent setup time
Pearn, W.L.; Hong, J.S.; Tai, Y.T. - In: International journal of production research : American … 51 (2013) 6, pp. 1694-1706
Persistent link: https://www.econbiz.de/10010054363
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Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time
Chung, S.H.; Pearn, W.L.; Tai, Y.T. - In: Journal of the Operational Research Society : OR 60 (2009) 7, pp. 921-933
Persistent link: https://www.econbiz.de/10008261992
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Minimising makespan on parallel batch processing machines with non-identical ready time and arbitrary job sizes
Chung, S.H.; Tai, Y.T.; Pearn, W.L. - In: International journal of production research : American … 47 (2009) 18, pp. 5109-5128
Persistent link: https://www.econbiz.de/10008268735