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Armstrong, J.R.
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Hurley, P.
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Martin, A.
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Pulp & paper Canada
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Quality and reliability engineering international
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Investigation of Reliability Measurements with Ramped and Constant Voltage Stress on MOS Gate Oxides
Martin, A.
;
O'Sullivan, P.
;
Mathewson, A.
- In:
Quality and reliability engineering international
12
(
1996
)
4
,
pp. 281-286
Persistent link: https://www.econbiz.de/10006403124
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Controlling filler retention in mechanical grades
Tomney, T.
;
Pruszynski, P.E.
;
Armstrong, J.R.
;
Hurley, P.
- In:
Pulp & paper Canada
99
(
1998
)
8
,
pp. 66-69
Persistent link: https://www.econbiz.de/10008361492
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