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Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C pmk
Pearn, W.L.; Shu, M.H.; Hsu, B.M. - In: International journal of production research : American … 43 (2005) 12, pp. 2493-2512
Persistent link: https://www.econbiz.de/10006124351
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Lower confidence bounds for C PU and C PL based on multiple samples with application to production yield assurance
Pearn, W.L.; Shu, M.H.; Hsu, B.M. - In: International journal of production research : American … 42 (2004) 12, pp. 2339-2356
Persistent link: https://www.econbiz.de/10006125808
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Bootstrap approach for supplier selection based on production yield
Wu, C.-W.; Shu, M.H.; Pearn, W.L.; Liu, K.H. - In: International journal of production research : American … 46 (2008) 18, pp. 5211-5230
Persistent link: https://www.econbiz.de/10008147335
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Estimating process yield based on <i>S<sub>pk<-sub><-i> for multiple samples
Pearn, W.L.; Cheng, Ya Ching - In: International journal of production research : American … 45 (2007) 1, pp. 49-64
Persistent link: https://www.econbiz.de/10007391766
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An effective decision making method for product acceptance
Pearn, W.L.; Wu, Chien-Wei - In: Omega : the international journal of management science 35 (2007) 1, pp. 12-21
Persistent link: https://www.econbiz.de/10007392169
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Minimizing the total machine workload for the wafer probing scheduling problem
Pearn, W.L.; Chung, S.H.; Yang, M.H. - In: IIE transactions / Institute of Industrial Engineers, … 34 (2002) 2, pp. 211-220
Persistent link: https://www.econbiz.de/10006177434
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Analytic network process (ANP) approach for product mix planning in semiconductor fabricator
Chung, Shu-Hsing; Lee, Amy H.I.; Pearn, W.L. - In: International journal of production economics 96 (2005) 1, pp. 15-36
Persistent link: https://www.econbiz.de/10006230254
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The Integrated Circuit Packaging Scheduling Problem (ICPSP): A Case Study
Pearn, W.L.; Chung, S.H.; Yang, M.H.; Chen, C.Y. - In: International journal of industrial engineering : … 12 (2005) 3, pp. 296-307
Persistent link: https://www.econbiz.de/10005919703
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Assessing Process Performance Based on the Process Incapability Index Cpp
Lin, P.C.; Pearn, W.L. - In: International journal of industrial engineering : … 12 (2005) 2, pp. 145-158
Persistent link: https://www.econbiz.de/10005921315
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Testing process performance based on capability index Cpk with critical values
Pearn, W.L.; Lin, P.C. - In: Computers & industrial engineering : CAIE ; an … 47 (2004) 4, pp. 351-370
Persistent link: https://www.econbiz.de/10005923647